Laser Scanning Microscopes
A laser microscope that measures the positioned sample automatically at the press of a button. This product meets various needs in observation, measurement, and analysis with observation capabilities ranging from those of an optical microscope to those of an SEM, measuring capabilities for instantaneous and accurate scans of the profiles of various targets, and a rich set of analysis tools.
The VK-X3000 Series uses a triple scan approach to enable measurement of any target. White light interferometry, focus variation, and laser confocal scanning methods are used depending on the situation, ensuring high-accuracy measurement and analysis of any target. The triple scan approach offers unprecedented adaptability, allowing the system to achieve 0.01 nm resolution to identify the smallest surface irregularities on flat targets, while also offering the flexibility to measure targets with large height changes across areas as large as 50 x 50 mm. With its ability to perform high-magnification colour imaging, non-destructive cross-section measurements, and advanced surface characterization, the VK-X3000 3D Surface Profiler is the go-to-system for R & D and quality labs.
Extensive magnification coverage range in one device
- Magnification 42× to 28,800×
- Automatic focusing
- Observe any material
Instant, non-contact surface scanning
- No damage to target
- Accurate nano-level measurement
- Compatible with any shape or material
Unprecedented surface characterisation
- Quantification of even the most detailed shapes
- Differentiate surfaces easily
- Roughness analysis
Triple Scan Approach Enables Measurement of Any Target
Highly accurate measurement of any target is possible through the use of three different measurement principles: laser confocal, white light interferometry, and focus variation.