Laser Scanning Microscopes
A laser microscope that measures the positioned sample automatically at the press of a button. This product meets various needs in observation, measurement, and analysis with observation capabilities ranging from those of an optical microscope to those of an SEM, measuring capabilities for instantaneous and accurate scans of the profiles of various targets, and a rich set of analysis tools.
Products Lineup
The VK-X4000 Series 3D Laser Scanning Microscope combines laser confocal, white light interferometry, and focus variation methods into a single metrology system, enabling highly accurate, non-contact measurements on nearly any material and surface geometry. Its newly-developed multi-point measurement function further streamlines the analysis process by automating measurements across multiple locations and samples—eliminating complex setup or programming while delivering greater usability, throughput, and repeatability.
Features
Three Measurement Principles in One System: Unmatched 3D Precision for Any Surface, Any Material, Any Geometry
Laser Confocal
Measure any material, any shape.
White Light Interferometry
Accurately capture 3D surface data with sub-nanometre resolution.
Focus Variation
Measure fine surface detail over a large area.
Multi-Point Scan for Easy & Automated 3D Measurements
Multi-Point Measurement
Easily configure position, coordinates, and magnification settings simply by clicking the point to be measured.
Automatic Measurement of Multiple Features
Target features on a part can be easily selected. All measurement conditions are automatically applied.