Non-Contact Roughness 

[NEW VK-X1000]

 

Laser microscope VK-X1000 can perform non-contact profile, roughness, and film thickness measurements with nanometre-level resolution on any material or shape. Unlike interferometers or other 3D measurement systems, even objects with steep or curved surfaces or those that don't reflect light very well can be accurately measured.

By combining white light with a laser light source, laser scanning microscopes are able to scan a surface and collect both an optical image and high-resolution surface data. Nanometre-level heights can be measured by analysing the intensity of the returned laser light relative to the z-position of the laser. Measurement is extremely accurate and fast. 

Conventional 3D measurement systems, such as contact profilers and interferometers can damage the material being measured or are unable to provide data on certain materials and surfaces. These devices can also be costly, time-consuming to operate, and difficult to use.

Simply place your sample on the stage, click measure, and the VK-X1000 will automatically scan and measure your sample. Our advanced analysis software will automatically analyse the data and recommend key roughness parameters to evaluate.