3D Non Contact Metrology
For Wide Area Analysis.

No matter if it is MM, Micron or Nano, you will get what you aim, with the 3-in-1 (Optical, Laser, White Light Interferometer) principle.

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Flexibly implement in any environment. Large stage customization is available.
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3D Non Contact Metrology For Wide Area Analysis.

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3D Non Contact Metrology
For Wide Area Analysis.