3D Metrology For Wide Area Analysis.

No matter if it is MM, Micron or Nano, you will get what you aim, with the 3-in-1 (Optical, Laser, White Light Interferometer) principle.



  • Flexibly implement in any environment. Large stage customization is available.

We guarantee 100% privacy – your information will never be shared.

Privacy Statement

Online Member Benefits

  • Instant product catalogue and technical guide downloads
  • Seamlessly submit requests for pricing and demonstrations
  • One-time registration, unlimited access

Register

Step 1/3

Please provide the information below to create your KEYENCE web account. This One-Time registration unlocks unlimited access to our web resources.

KEYENCE Technical E-News

Check Your Inbox

We've just emailed a verification link to .
Once it arrives, it will be valid for 24 hours.
Didn't receive an email? Please check your spam or junk folder.