High-performance Micro Static Eliminator

SJ-M series

High-performance Micro Ioniser Head

Sensing Ioniser only 10mm in Diameter

Super-small Head that Can be Mounted Anywhere

Super-small Head that Can be Mounted Anywhere

Super-small Static Elimination Head

The super-small static elimination head measures only 10 mm in diameter. This direct static elimination structure featuring the ion generator in its tip ensures no attenuation in ion generation. In spite of its compact body, the head supplies a large number of ions to allow quick and accurate static elimination.

C.A.B Probe Type (SJ-M020G)

C.A.B Probe Type (SJ-M020G)

Reduces maintenance frequency (Provides a maintenance interval five times longer than convention models)

Compact & Wide (SJ-M030,SJ-M070)

Compact and Wide

Fastest Static Elimination in Its Class with The Pulse AC Method[Spot,Wide]

The Pulse AC Method Enables Static Elimination at Class-highest Speed.

The pulse AC method differs from conventional models in that the voltage applied to its electrode probes starts up very quickly, allowing a large ion discharge for fast and effective static elimination in a short period of time.

High-precision Ion Balance with the I.C.C. Method[Spot,Wide]

High-precision Ion Balance with The I.C.C. Method

By sensing the strength of the workpiece's electrostatic charge and providing feedback, the SJ-M automatically controls the quantity of ions generated to maintain the optimum balance.

The A.C.A.B System Keeps Static Elimination Capacity for a Long Period.

The A.C.A.B System Keeps Static Elimination Capacity for a Long Period.

The SJ-M Series uses the “Advanced Clean Air Barrier” (A.C.A.B) system that has been advanced from the conventional clear air barrier system. The A.C.A.B system provides a “laminar flow” by controlling the flow of supplied clean dry air around the electrode probe. This function remarkably reduces adhesion of foreign objects to the tip of the electrode probe, suppressing deterioration of static elimination capacity to the maximum extent.

Flat-cut Probe Reduces Dust Accumulation

Flat-cut Probe Reduces Dust Accumulation

The newly developed flat-cut probe does a remarkable job of reducing wear or dust accumulation on the tip of the electrode probe. This probe is suitable for a clean environment.

Flexible Installation of a ø10 mm Head into Existing Equipment

Flexible Installation of a ø10 mm Head into Existing Equipment

The newly developed flat-cut probe does a remarkable job of reducing wear or dust accumulation on the tip of the electrode probe. This probe is suitable for a clean environment.

The Heat-resistant Design Enlarges the Available Environmental Range.

The Heat-resistant Design Enlarges the Available Environmental Range.

The SJ-M Series provides heat resistance of up to 80°C, enabling applications even in a high-temperature environment. It is suitable for static elimination in preheating processes or in models.

Comparison of static elimination speed

Comparison of static elimination speed

Measuring conditions for comparative test conducted by KEYENCE
Charged voltage: +1 kV
Plate monitor: 150 mm x 150 mm (20 pF)
Installation distance: 50 mm

Secular change in static elimination speed (Typical)

Secular change in static elimination speed (Typical)

The above chart shows a change in the static elimination time attributable to dirt or deterioration of the electrode probe.
As the Ioniser maintains a shorter static elimination time relative to the operation time, it can reduce maintenance frequency.

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