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LK-G Series CCD Laser Displacement Sensor
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Affordable and 100% Reliable Measurement for Steel Manufacturer
Non-contact Measurement Sensors Reduces Scrap, Provides 100% Inspection
Features

Precision, High Accuracy and Long Distance

Innovative CCD Laser Displacement Sensors

For Full Details Download the PRODUCT CATALOG Using the SERVICE PULLDOWN Above.

HIGH PRECISION - LK-G10/G15 Series

Super Precision Sensor with High Repeatability of 0.0004 Mil (0.01µm)
HIGH PRECISION - LK-G10/G15 Series

HIGH ACCURACY - LK-G32/G37 Series

Reliable Measurement of Transparent Objects, Plastics, and Metals
HIGH ACCURACY - LK-G32/G37 Series

HIGH STABILITY - LK-G82/G87 Series (Multi-purpose)

New Technology allows for better stability in high precision applications requiring alonger measuring distance.
HIGH STABIRITY - LK-G82/G87 Series

LONG DISTANCE - LK-G152/G157 Series

Combining high-accuracy with long range and the fastest sampling speed Measuring range: 5.91 ±1.57" (150 ±40mm)
LONG DISTANCE - LK-G152/G157 Series

HIGH SPEED, LONG DISTANCE - LK-G402/G407 Series

Combining high-accuracy with long range and the fastest sampling speed Measuring range: 15.75" ±3.94" (400 ±100mm)
HIGH SPEED, LONG DISTANCE - LK-G402/G407 Series

ULTRA LONG DISTANCE - LK-G502/G507 Series

High precision, high speed, ultra-long range. A measuring range 1.5 times that of conventional models 39.37" (1000 mm) Max.
ULTRA LONG DISTANCE - LK-G502/G507 Series

Ultra-high Speed Sampling of 50 kHz

[All Models: LK-G10/15/32/37/82/87/152/157/402/407/502/507]
The Li-CCD features high-speed sampling 25 times faster than conventional models. High-speed digital processing of signals from the Li-CCD is performed by a special waveform-processor (Digital Signal Processor), satisfying both highspeed and high-accuracy measurements. Targets traveling, rotating, or vibrating at high speed can be measured reliably.
Measuring the surface runout of a HDD rotating at high speed.

High Accuracy of ±0.03 %

[Models: LK-G10/15]
KEYENCE has redesigned the optical system in order to achieve high-accuracy measurements. Incorporating Ernostar optical systems with a Li-CCD produces excellent linearity characteristics.
Measuring the thickness of a silicon wafer.

High Repeatability of 0.0004 Mil (0.01 µm)

[Models: LK-G10/15]
The CPU, which is integrated in the sensor head, digitizes all signals to the controller, dramatically reducing disturbance noise. A highly rigid die-cast body is used to reduce deviations caused by temperature changes, and a Li-CCD with 10 times better sensitivity than conventional models is used to reduce signal noise. These design revisions, targeting high accuracy applications, have successfully produced a repeatability that is 20 times better than conventional models.
Controlling the position of a high-accuracy processing stage.

High-accuracy Lens Unit

Reducing errors caused by aberrations
KEYENCE has designed a new light-receiving unit for concentrating reflected light onto the Li-CCD. The newly-developed, high accuracy Ernostar lens drastically reduce spot distortion caused by aberrations. In addition, a special die-cast housing integrating the sensor head with the lenses is employed, achieving excellent rigidity.
Block diagram of the high-accuracy Ernostar lens
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